FTIR is the primary method for material and contaminant identification but lacks sensitivity to metallic components. X-ray fluorescence (XRF) can fill this gap and improve identification accuracy.
Combining X-ray Fluorescence, Infrared Spectroscopy and Software Algorithms for Positive Material and Contaminant Identification
Related Posts
The Definition of a Fool is a Drowning Man Who Tries to Keep It a Secret
If drowning and in need of help, most people would yell for assistance. Similarly, choosing the wrong calibration…
Performance Measures Not Always What They Appear
At times, performance measures reveal a hidden story that can only be found by peeling back the onion.…
Building a Digital Immune System to Improve Software Quality
Table of Contents Why is It important to Build a Digital Immune System? How Digital Immune System works…
