FTIR is the primary method for material and contaminant identification but lacks sensitivity to metallic components. X-ray fluorescence (XRF) can fill this gap and improve identification accuracy.
Combining X-ray Fluorescence, Infrared Spectroscopy and Software Algorithms for Positive Material and Contaminant Identification
Related Posts
A New Era of Holistic Quality
The future impact of ISO and the GHG Protocol (September 12th) on quality is characterized by a significant…
The Hidden Threat to Project Success: Managing Scope Creep in Engineering
Nearly half of engineering projects face scope creep, resulting in cost overruns and delays. Key causes include unclear…
Rework Management: Turning Challenges into Opportunities for Manufacturers
Rework and product returns are common issues in manufacturing that can impact efficiency and customer trust. By implementing…