“The biggest challenge with CMMs is that they are CMMs. They have been in the industry for a very long time and typically have a negative connotation about them.
CMM Technology on the “Shop Floor”? Why Not!
Related Posts
Combining X-ray Fluorescence, Infrared Spectroscopy and Software Algorithms for Positive Material and Contaminant Identification
FTIR is the primary method for material and contaminant identification but lacks sensitivity to metallic components. X-ray fluorescence…
Scholarship Memorializing Metrology Legend, DMSC Co-founder, Bailey Squier, Created for UNC Charlotte Students
With the passing of Bailey Squier, co-founder of Digital Metrology Standards Consortium (DMSC), its Board of Directors contemplated…