The push for smaller, more complex device components has spiked the need for precise, non-damaging metrology, with 3D X-ray microscopy (XRM) leading the way. This technology offers high-resolution measurements critical for quality control in the electronics and manufacturing industries.
Taking Industrial Metrology to the Next Level: Dimensional Measurements with 3D X-ray Microscopy
Related Posts
NDT Robotic Path Planning: Automatic Methods for Ultrasonic Scanning Paths Generation
Robotic inspection path planning can be tedious, but ultrasonic testing path programming must be fully automated and user-friendly.
Fowler High Precision, Sylvac SA SP25 Scanning Probe for Select Optical Scan Machines
Fowler High Precision and Sylvac SA announced a transformative measuring solution to its existing optical scan machines with…
Rethinking Quality: Why Additive Manufacturing Must Grow Up to Move Forward
Many subcontract bureaus prioritize cost and delivery times over the essential need for high-quality output, hindering the adoption…